The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...

The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...

This is a preview. Log in through your library . Abstract We consider the problem of testing whether two independent finite-dimensional random dot product graphs have generating latent positions that ...